@misc{dl2-17-1,
  title={Tent: Fully Test-time Adaptation by Entropy Minimization},
  author={Dequan Wang, Evan Shelhamer, Shaoteng Liu, Bruno Olshausen, Trevor Darrell},
  year={2021},
  url={https://arxiv.org/abs/2006.10726v3}
}
@misc{dl2-17-2,
  title={Continual Test-Time Domain Adaptation},
  author={Qin Wang, Olga Fink, Luc Van Gool, Dengxin Dai},
  year={2022},
  url={https://arxiv.org/abs/2203.13591}
}
@misc{dl2-17-3,
  title={Efficient Test-Time Model Adaptation without Forgetting},
  author={Shuaicheng Niu, Jiaxiang Wu, Yifan Zhang, Yaofo Chen, Shijian Zheng, Peilin Zhao, Mingkui Tan},
  year={2022},
  url={https://arxiv.org/abs/2204.02610v2}
}
@misc{dl2-17-4,
  title={Towards Stable Test-Time Adaptation in Dynamic Wild World},
  author={Shuaicheng Niu, Jiaxiang Wu, Yifan Zhang, Zhiquan Wen, Yaofo Chen, Peilin Zhao, Mingkui Tan},
  year={2023},
  url={https://arxiv.org/abs/2302.12400}
}
@misc{dl2-17-5,
  title={MEMO: Test Time Robustness via Adaptation and Augmentation},
  author={Marvin Zhang, Sergey Levine, Chelsea Finn},
  year={2022},
  url={https://arxiv.org/abs/2110.09506}
}
@misc{dl2-17-6,
  title={Test-Time Classifier Adjustment Module for Model-Agnostic Domain Generalization},
  author={Yusuke Iwasawa, Yutaka Matsuo},
  year={2021},
  url={https://papers.neurips.cc/paper_files/paper/2021/hash/1415fe9fea0fa1e45dddcff5682239a0-Abstract.html}
}